A Comprehensive Solution to Automated Inspection Device Selection Problems using ELECTRE Methods
Selection of an automated inspection device for an explicit industrial application is one of the most challenging problems in the current manufacturing environment. It has become more and more complicated due to increasing complexity, advanced features and facilities that are endlessly being integra...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Universitas Indonesia
2014-07-01
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| Series: | International Journal of Technology |
| Subjects: | |
| Online Access: | http://ijtech.eng.ui.ac.id/article/view/1288 |