Real Time Spectroscopic Ellipsometry Analysis of First Stage CuIn1−xGaxSe2 Growth: Indium-Gallium Selenide Co-Evaporation

Real Time Spectroscopic Ellipsometry Analysis of First Stage CuIn1−xGaxSe2 Growth: Indium-Gallium Selenide Co-Evaporation

Real time spectroscopic ellipsometry (RTSE) has been applied for in-situ monitoring of the first stage of copper indium-gallium diselenide (CIGS) thin film deposition by the three-stage co-evaporation process used for fabrication of high efficiency thin film photovoltaic (PV) devices. The first stag...

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Bibliographic Details
Main Authors: Puja Pradhan, Puruswottam Aryal, Dinesh Attygalle, Abdel-Rahman Ibdah, Prakash Koirala, Jian Li, Khagendra P. Bhandari, Geethika K. Liyanage, Randy J. Ellingson, Michael J. Heben, Sylvain Marsillac, Robert W. Collins, Nikolas J. Podraza
Format: Article
Language:English
Published: MDPI AG 2018-01-01
Series:Materials
Subjects:
spectroscopic ellipsometry
III2-VI3 semiconductor materials
real time analysis
complex dielectric function
photovoltaic cells
thickness measurement
compositional analysis
CuIn1−xGaxSe2
Online Access:http://www.mdpi.com/1996-1944/11/1/145

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http://www.mdpi.com/1996-1944/11/1/145

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