Image-Alignment Based Matching for Irregular Contour Defects Detection
Automatic defect inspection is attractive for high-quality workpiece manufacturing with irregular contours in order to achieve high accuracy and no contour defect. Thus, a novel image alignmentbased feature matching algorithm framework is proposed in this paper. It can be used to solve the specified...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2018-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8534326/ |