Study on the AFM Force Curve Common Errors and Their Effects on the Calculated Nanomechanical Properties of Materials
The atomic force microscope (AFM) force curve has been widely used for determining the mechanical properties of materials due to its high resolution, whereby very low (piconewton) forces and distances as small as nanometers can be measured. However, sometimes the resultant force curve obtained from...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
2016-01-01
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| Series: | Journal of Engineering |
| Online Access: | http://dx.doi.org/10.1155/2016/2456378 |