Writing Field Analysis for Shingled Bit-Patterned Magnetic Recording

A novel method utilizing response surface methodology (RSM) is proposed for effective analysis of the combined influence of writing head geometry and media properties on writing field performance. The method comprises two main modules: (1) a parametric writing head model based on finite element elec...

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Bibliographic Details
Main Authors: X. G. Li, Z. J. Liu, A. G. Kang, X. Y. Xie
Format: Article
Language:English
Published: Hindawi Limited 2017-01-01
Series:Journal of Nanomaterials
Online Access:http://dx.doi.org/10.1155/2017/4254029