Scanning probe microscopy applied to the study of domains and domain walls in a ferroelectric KNbO<sub>3</sub> crystal

Scanning probe microscopy applied to the study of domains and domain walls in a ferroelectric KNbO<sub>3</sub> crystal

A commercial Atomic Force Microscope (AFM) and a semi-home made Scanning Near-Field Optical Microscope (SNOM) have been used to characterize electrically, topographically and optically the domain walls among natural ferroelectric domains in a KNbO3 crystal. The AFM measurements have been performed w...

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Bibliographic Details
Main Authors: Martínez-Pastor, J., Valdés, J. L., Martín-Carrón, L., Canet-Ferrer, J.
Format: Article
Language:English
Published: Elsevier 2006-06-01
Series:Boletín de la Sociedad Española de Cerámica y Vidrio
Subjects:
KNbO3
ferroelectric
domain-wall
SNOM and AFM
ferroeléctrico
pared de dominio
SNOM y AFM
Online Access:http://ceramicayvidrio.revistas.csic.es/index.php/ceramicayvidrio/article/view/309/328

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http://ceramicayvidrio.revistas.csic.es/index.php/ceramicayvidrio/article/view/309/328

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