FAILURE RATE ESTIMATION IN FIELD FOR A DEFECT, IN FUNCTION OF MANUFACTURING DEFECTIVITY DENSITY - CASE STUDY FOR A GATE OXIDE RUPTURE ON VALVE DRIVER IN AUTOMOTIVE SEMICONDUCTOR
Whatever industrial environment, failure rate prediction is important at different levels. Firstly, this prediction will be provided to customers when several failures with a same signature are observed in field: customers’ request will fit with the number of future failures expected in field, f...
| Main Author: | |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
ICT Academy of Tamil Nadu
2018-04-01
|
| Series: | ICTACT Journal on Microelectronics |
| Subjects: | |
| Online Access: | http://ictactjournals.in/paper/IJME_Vol_4_Iss_1_Paper_6_537_541.pdf |