An Abnormal Nitric Oxide Metabolism Contributes to Brain Oxidative Stress in the Mouse Model for the Fragile X Syndrome, a Possible Role in Intellectual Disability

Background. Fragile X syndrome is the most common genetic cause of mental disability. Although many research has been performed, the mechanism underlying the pathogenesis is unclear and needs further investigation. Oxidative stress played major roles in the syndrome. The aim was to investigate the n...

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Main Authors: Elena Lima-Cabello, Francisco Garcia-Guirado, Rocio Calvo-Medina, Rajaa el Bekay, Lucia Perez-Costillas, Carolina Quintero-Navarro, Lourdes Sanchez-Salido, Yolanda de Diego-Otero
Format: Article
Language:English
Published: Hindawi Limited 2016-01-01
Series:Oxidative Medicine and Cellular Longevity
Online Access:http://dx.doi.org/10.1155/2016/8548910