Genome-Wide Association Mapping of Leaf Rust Response in a Durum Wheat Worldwide Germplasm Collection

Genome-Wide Association Mapping of Leaf Rust Response in a Durum Wheat Worldwide Germplasm Collection

Leaf rust (caused by Erikss. []) is increasingly impacting durum wheat ( L. var. ) production with the recent appearance of races with virulence to widely grown cultivars in many durum producing areas worldwide. A highly virulent race on durum wheat was recently detected in Kansas. This race may s...

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Bibliographic Details
Main Authors: Meriem Aoun, Matthew Breiland, M. Kathryn Turner, Alexander Loladze, Shiaoman Chao, Steven S. Xu, Karim Ammar, James A. Anderson, James A. Kolmer, Maricelis Acevedo
Format: Article
Language:English
Published: Wiley 2016-11-01
Series:The Plant Genome
Online Access:https://dl.sciencesocieties.org/publications/tpg/articles/9/3/plantgenome2016.01.0008

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https://dl.sciencesocieties.org/publications/tpg/articles/9/3/plantgenome2016.01.0008

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