Characterizing Depth of Defects with Low Size/Depth Aspect Ratio and Low Thermal Reflection by Using Pulsed IR Thermography

Characterizing Depth of Defects with Low Size/Depth Aspect Ratio and Low Thermal Reflection by Using Pulsed IR Thermography

This study is focused on the quantitative estimation of defect depth by applying pulsed thermal nondestructive testing. The majority of known defect characterization techniques are based on 1D heat conduction solutions, thus being inappropriate for evaluating defects with low aspect ratios. A novel...

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Bibliographic Details
Main Authors: Alexey I. Moskovchenko, Michal Švantner, Vladimir P. Vavilov, Arsenii O. Chulkov
Format: Article
Language:English
Published: MDPI AG 2021-04-01
Series:Materials
Subjects:
pulse thermography
defect aspect ratio
thermal reflection coefficient
thermal NDT
defect characterization
non-linear fitting
Online Access:https://www.mdpi.com/1996-1944/14/8/1886

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https://www.mdpi.com/1996-1944/14/8/1886

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