Mitigation and Predictive Assessment of SET Immunity of Digital Logic Circuits for Space Missions

Due to the intrinsic masking effects of combinational circuits in digital designs, Single-Event Transient (SET) effects were considered irrelevant compared to the data rupture caused by Single-Event Upset (SEU) effects. However, the importance of considering SET in Very-Large-System-Integration (VLS...

Full description

Bibliographic Details
Main Authors: Ygor Q. Aguiar, Frédéric Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul
Format: Article
Language:English
Published: MDPI AG 2020-02-01
Series:Aerospace
Subjects:
Online Access:https://www.mdpi.com/2226-4310/7/2/12