Mitigation and Predictive Assessment of SET Immunity of Digital Logic Circuits for Space Missions

Mitigation and Predictive Assessment of SET Immunity of Digital Logic Circuits for Space Missions

Due to the intrinsic masking effects of combinational circuits in digital designs, Single-Event Transient (SET) effects were considered irrelevant compared to the data rupture caused by Single-Event Upset (SEU) effects. However, the importance of considering SET in Very-Large-System-Integration (VLS...

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Bibliographic Details
Main Authors: Ygor Q. Aguiar, Frédéric Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul
Format: Article
Language:English
Published: MDPI AG 2020-02-01
Series:Aerospace
Subjects:
monte carlo simulation
single-event effects
radiation-hardening-by-design techniques
standard-cell design methodology
signal probability
mc-oracle
Online Access:https://www.mdpi.com/2226-4310/7/2/12

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