TEM and STEM Studies on the Cross-sectional Morphologies of Dual-/Tri-layer Broadband SiO2 Antireflective Films

TEM and STEM Studies on the Cross-sectional Morphologies of Dual-/Tri-layer Broadband SiO2 Antireflective Films

Abstract Dual-layer and tri-layer broadband antireflective (AR) films with excellent transmittance were successfully fabricated using base-/acid-catalyzed mixed sols and propylene oxide (PO) modified silica sols. The sols and films were characterized by scanning electron microscope (SEM), Fourier tr...

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Bibliographic Details
Main Authors: Shuangyue Wang, Hongwei Yan, Dengji Li, Liang Qiao, Shaobo Han, Xiaodong Yuan, Wei Liu, Xia Xiang, Xiaotao Zu
Format: Article
Language:English
Published: SpringerOpen 2018-02-01
Series:Nanoscale Research Letters
Subjects:
Sol–gel process
Antireflective film
TEM
STEM
Density ratio
Online Access:http://link.springer.com/article/10.1186/s11671-018-2442-4

Internet

http://link.springer.com/article/10.1186/s11671-018-2442-4

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