Improved Point Dipole Model for Subwavelength Resolution Scattering Near-Field Optical Microscopy (SNOM)
High-resolution microscopy technique is of significant importance for studying nanomaterials. It is necessary to understand the near-field interaction between the probe and substrate materials in order to get the fine structure of the nanomaterial in the subwavelength scale. The numerical methods su...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
2020-01-01
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| Series: | International Journal of Antennas and Propagation |
| Online Access: | http://dx.doi.org/10.1155/2020/9293018 |