Improved Point Dipole Model for Subwavelength Resolution Scattering Near-Field Optical Microscopy (SNOM)
High-resolution microscopy technique is of significant importance for studying nanomaterials. It is necessary to understand the near-field interaction between the probe and substrate materials in order to get the fine structure of the nanomaterial in the subwavelength scale. The numerical methods su...
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Series: | International Journal of Antennas and Propagation |
Online Access: | http://dx.doi.org/10.1155/2020/9293018 |
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doaj-e17503029af94feaa2a451adfee02f592020-11-25T02:51:08ZengHindawi LimitedInternational Journal of Antennas and Propagation1687-58691687-58772020-01-01202010.1155/2020/92930189293018Improved Point Dipole Model for Subwavelength Resolution Scattering Near-Field Optical Microscopy (SNOM)Guizhen Lu0Ruiqi Zhao1Hongcheng Yin2Zhihe Xiao3Jing Zhang4College of Electronic Engineering, Communication University of China, Beijing 100024, ChinaCollege of Electronic Engineering, Communication University of China, Beijing 100024, ChinaScience and Technology on Electromagnetic Scattering Laboratory, Beijing 100039, ChinaScience and Technology on Electromagnetic Scattering Laboratory, Beijing 100039, ChinaScience and Technology on Electromagnetic Scattering Laboratory, Beijing 100039, ChinaHigh-resolution microscopy technique is of significant importance for studying nanomaterials. It is necessary to understand the near-field interaction between the probe and substrate materials in order to get the fine structure of the nanomaterial in the subwavelength scale. The numerical methods such as FDTD, FEM, and MoM are inefficient for the SNOM problems because of the illness of the impedance matrix. The analytic method can only be used for some simple objects such as sphere. Here, a quasianalytical method is developed, in which the analytic formula is refined to adapt to various shapes of the probe approaching the curve of SNOM. By this way, it is helpful in comparing the performance of different probes and giving us a direction to design a new type probe in SNOM. As an application, the developed method is used to study the contrast in the SNOM for the interface between the two different surfaces that have different materials and topography.http://dx.doi.org/10.1155/2020/9293018 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Guizhen Lu Ruiqi Zhao Hongcheng Yin Zhihe Xiao Jing Zhang |
spellingShingle |
Guizhen Lu Ruiqi Zhao Hongcheng Yin Zhihe Xiao Jing Zhang Improved Point Dipole Model for Subwavelength Resolution Scattering Near-Field Optical Microscopy (SNOM) International Journal of Antennas and Propagation |
author_facet |
Guizhen Lu Ruiqi Zhao Hongcheng Yin Zhihe Xiao Jing Zhang |
author_sort |
Guizhen Lu |
title |
Improved Point Dipole Model for Subwavelength Resolution Scattering Near-Field Optical Microscopy (SNOM) |
title_short |
Improved Point Dipole Model for Subwavelength Resolution Scattering Near-Field Optical Microscopy (SNOM) |
title_full |
Improved Point Dipole Model for Subwavelength Resolution Scattering Near-Field Optical Microscopy (SNOM) |
title_fullStr |
Improved Point Dipole Model for Subwavelength Resolution Scattering Near-Field Optical Microscopy (SNOM) |
title_full_unstemmed |
Improved Point Dipole Model for Subwavelength Resolution Scattering Near-Field Optical Microscopy (SNOM) |
title_sort |
improved point dipole model for subwavelength resolution scattering near-field optical microscopy (snom) |
publisher |
Hindawi Limited |
series |
International Journal of Antennas and Propagation |
issn |
1687-5869 1687-5877 |
publishDate |
2020-01-01 |
description |
High-resolution microscopy technique is of significant importance for studying nanomaterials. It is necessary to understand the near-field interaction between the probe and substrate materials in order to get the fine structure of the nanomaterial in the subwavelength scale. The numerical methods such as FDTD, FEM, and MoM are inefficient for the SNOM problems because of the illness of the impedance matrix. The analytic method can only be used for some simple objects such as sphere. Here, a quasianalytical method is developed, in which the analytic formula is refined to adapt to various shapes of the probe approaching the curve of SNOM. By this way, it is helpful in comparing the performance of different probes and giving us a direction to design a new type probe in SNOM. As an application, the developed method is used to study the contrast in the SNOM for the interface between the two different surfaces that have different materials and topography. |
url |
http://dx.doi.org/10.1155/2020/9293018 |
work_keys_str_mv |
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