A Statistical Submodule Open-Circuit Failure Diagnosis Method for Modular Multilevel Converters (MMCs) With Variance Measurement

A Statistical Submodule Open-Circuit Failure Diagnosis Method for Modular Multilevel Converters (MMCs) With Variance Measurement

Submodule (SM) open-circuit failures severely affect the reliable operation of modular multilevel converter (MMCs). A comprehensive SM open-circuit failure diagnosis process includes three steps with failure detection, localization, and classification. However, the existing diagnosis methods perform...

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Bibliographic Details
Main Authors: Heya Yang, Weihao Zhou, Jing Sheng, Haoze Luo, Chushan Li, Wuhua Li, Xiangning He
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Open Journal of Power Electronics
Subjects:
Open-circuit failure
failure diagnosis
modular multilevel converters
statistical analysis
Online Access:https://ieeexplore.ieee.org/document/9088209/

Internet

https://ieeexplore.ieee.org/document/9088209/

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