Electron Diagnostics for Extreme High Brightness Nano-Blade Field Emission Cathodes

Electron Diagnostics for Extreme High Brightness Nano-Blade Field Emission Cathodes

Electron beams are essential tools in modern science. They are ubiquitous in fields ranging from microscopy to the creation of coherent ultra-fast X-rays to lithography. To keep pace with demand, electron beam brightness must be continually increased. One of the main strategic aims of the Center for...

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Bibliographic Details
Main Authors: Gerard Lawler, Kunal Sanwalka, Yumeng Zhuang, Victor Yu, Timo Paschen, River Robles, Oliver Williams, Yusuke Sakai, Brian Naranjo, James Rosenzweig
Format: Article
Language:English
Published: MDPI AG 2019-10-01
Series:Instruments
Subjects:
high brightness
electron source
field emission cathode
electron optics
cathode diagnostics
Online Access:https://www.mdpi.com/2410-390X/3/4/57

Internet

https://www.mdpi.com/2410-390X/3/4/57

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