Investigating the Defect Structures in Transparent Conducting Oxides Using X-ray and Neutron Scattering Techniques

Investigating the Defect Structures in Transparent Conducting Oxides Using X-ray and Neutron Scattering Techniques

Transparent conducting oxide (TCO) materials are implemented into a wide variety of commercial devices because they possess a unique combination of high optical transparency and high electrical conductivity. Created during the processing of the TCOs, defects within the atomic-scale structure are res...

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Bibliographic Details
Main Author: Gabriela B. González
Format: Article
Language:English
Published: MDPI AG 2012-05-01
Series:Materials
Subjects:
transparent conducting oxide
indium-tin oxide
tin oxide
zinc oxide
defect
x-ray diffraction
neutron diffraction
EXAFS
XRF
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Online Access:http://www.mdpi.com/1996-1944/5/5/818

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http://www.mdpi.com/1996-1944/5/5/818

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