Correlation of resistance switching and polarization rotation in copper doped zinc oxide (ZnO:Cu) thin films studied by Scanning Probe Microscopy
This paper presents multiple-modes Scanning Probe Microscopy (SPM) studies on characterize the correlation of resistance switching (RS) and polarization rotation (PR) in copper doped ZnO (ZnO:Cu) thin films. Firstly, the bipolar RS behavior is confirmed by conductive Atomic Force Microscopy (c-AFM)....
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2019-12-01
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| Series: | Journal of Materiomics |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2352847819300711 |