Self-Recovery Tolerance Latch Design Based on the Radiation Mechanism
Digital latches are becoming more sensitive to Multiple-Node Upsets (MNUs) due to lower supply voltage and higher integration density of devices. The hardening technique based on using multiple C-Elements (CEs) (the CE acts as an inverter if its inputs are equal to each other, otherwise holds the hi...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9268098/ |