Self-Recovery Tolerance Latch Design Based on the Radiation Mechanism
Digital latches are becoming more sensitive to Multiple-Node Upsets (MNUs) due to lower supply voltage and higher integration density of devices. The hardening technique based on using multiple C-Elements (CEs) (the CE acts as an inverter if its inputs are equal to each other, otherwise holds the hi...
Main Authors: | Qiang Li, Xiaohui Su, Jing Guo, Chunhua Qi |
---|---|
Format: | Article |
Language: | English |
Published: |
IEEE
2020-01-01
|
Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9268098/ |
Similar Items
-
Design of Robust Latch for Multiple-Node Upset (MNU) Mitigation in Nanoscale CMOS Technology
by: Nan Zhang, et al.
Published: (2020-01-01) -
Design and Analysis of SEU Hardened Latch for Low Power and High Speed Applications
by: Satheesh Kumar S, et al.
Published: (2019-07-01) -
LIHL: Design of a Novel Loop Interlocked Hardened Latch
by: Hui Xu, et al.
Published: (2021-08-01) -
Single event latch-up detection for nano-satellite external solar radiation mitigation system
by: Ayob, M.F, et al.
Published: (2020) -
Analysis and Mitigation of Multiple Radiation Induced Errors in Modern Circuits
by: Watkins, Adam
Published: (2016)