Overview of radiation effects on emerging non-volatile memory technologies

In this paper we give an overview of radiation effects in emergent, non-volatile memory technologies. Investigations into radiation hardness of resistive random access memory, ferroelectric random access memory, magneto-resistive random access memory, and phase change memory are presented...

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Bibliographic Details
Main Authors: Fetahović Irfan S., Dolićanin Edin, Lazarević Đorđe R., Lončar Boris B.
Format: Article
Language:English
Published: VINCA Institute of Nuclear Sciences 2017-01-01
Series:Nuclear Technology and Radiation Protection
Subjects:
Online Access:http://www.doiserbia.nb.rs/img/doi/1451-3994/2017/1451-39941704381F.pdf