Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy and Parametric t-SNE

Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy and Parametric t-SNE

In this paper, a novel method with cross-wavelet singular entropy (XWSE)-based feature extractor and support vector machine (SVM) is proposed for analog circuit fault diagnosis. Primarily, cross-wavelet transform (XWT), which possesses a good capability to restrain the environment noise, is applied...

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Bibliographic Details
Main Authors: Wei He, Yigang He, Bing Li, Chaolong Zhang
Format: Article
Language:English
Published: MDPI AG 2018-08-01
Series:Entropy
Subjects:
analog circuit
fault diagnosis
cross wavelet transform
Tsallis entropy
parametric t-distributed stochastic neighbor embedding
support vector machine
Online Access:http://www.mdpi.com/1099-4300/20/8/604

Internet

http://www.mdpi.com/1099-4300/20/8/604

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