Nonlinear scanning structured illumination microscopy based on nonsinusoidal modulation

Nonlinear scanning structured illumination microscopy based on nonsinusoidal modulation

Structured illumination microscopy (SIM) is an essential super-resolution microscopy technique that enhances resolution. Several images are required to reconstruct a super-resolution image. However, linear SIM resolution enhancement can only increase the spatial resolution of microscopy by a factor...

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Bibliographic Details
Main Authors: Meiting Wang, Lei Wang, Xiaomin Zheng, Jie Zhou, Jiajie Chen, Youjun Zeng, Junle Qu, Yonghong Shao, Bruce Zhi Gao
Format: Article
Language:English
Published: World Scientific Publishing 2021-09-01
Series:Journal of Innovative Optical Health Sciences
Subjects:
super-resolution image
structured illumination microscopy
nonsinusoidal function
Online Access:http://www.worldscientific.com/doi/epdf/10.1142/S1793545821420025

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http://www.worldscientific.com/doi/epdf/10.1142/S1793545821420025

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