Arsenic Exposure and Methylation Efficiency in Relation to Oxidative Stress in Semiconductor Workers

This study examined associations between oxidative stress and arsenic (As) exposure and methylation efficiency in semiconductor workers. An As-exposed group (n = 427) and a control group (n = 91) were included. The As-exposure group (n = 427) included 149 maintenance staff members and 278 production...

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Bibliographic Details
Main Authors: Chih-Hong Pan, Ching-Yu Lin, Ching-Huang Lai, Hueiwang Anna Jeng
Format: Article
Language:English
Published: MDPI AG 2020-05-01
Series:Atmosphere
Subjects:
Online Access:https://www.mdpi.com/2073-4433/11/5/464