Small angle x-ray scattering and electron microscopy of nanoparticles formed in an electrical arc

Small angle x-ray scattering and electron microscopy of nanoparticles formed in an electrical arc

Small Angle X-ray Scattering has been used to characterize nanoparticles generated by electrical arcing between metallic (AgSnO2) electrodes. The particles are found to have diameters between 30 and 40 nm and display smooth surfaces suggesting that they are either in liquid form or have solidified f...

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Bibliographic Details
Main Authors: E. Carvou, J. L. Le Garrec, J. Pérez, J. Praquin, M. Djeddi, J. B. A. Mitchell
Format: Article
Language:English
Published: AIP Publishing LLC 2013-03-01
Series:AIP Advances
Online Access:http://link.aip.org/link/doi/10.1063/1.4799061

Internet

http://link.aip.org/link/doi/10.1063/1.4799061

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