Test-retest reliability of transcranial magnetic stimulation EEG evoked potentials

Test-retest reliability of transcranial magnetic stimulation EEG evoked potentials

Background: Transcranial magnetic stimulation (TMS)-evoked potentials (TEPs), recorded using electroencephalography (TMS-EEG), offer a powerful tool for measuring causal interactions in the human brain. However, the test-retest reliability of TEPs, critical to their use in clinical biomarker and int...

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Bibliographic Details
Main Authors: Lewis J. Kerwin, Corey J. Keller, Wei Wu, Manjari Narayan, Amit Etkin
Format: Article
Language:English
Published: Elsevier 2018-05-01
Series:Brain Stimulation
Subjects:
Transcranial magnetic stimulation (TMS)
Electroencephalogram (EEG)
Evoked potentials
Reliability
Plasticity
Online Access:http://www.sciencedirect.com/science/article/pii/S1935861X17310264

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http://www.sciencedirect.com/science/article/pii/S1935861X17310264

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