A Novel High-Performance Low-Cost Double-Upset Tolerant Latch Design
Single event double upsets (SEDUs) caused by charge sharing have been an important contributor to the soft error in integrated circuits. Most of the up-to-date double-upset (DU) tolerant latches suffer from high costs in terms of delay, power and area. In this paper, we propose a novel high-performa...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2018-10-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | http://www.mdpi.com/2079-9292/7/10/247 |