An Efficient Stacking Model of Multi-Label Classification Based on Pareto Optimum

Nowadays, multi-label data are ubiquitous in real-world applications, in which each instance is associated with a set of labels. Multi-label learning has attracted significant attentions from researchers and plenty of algorithms have been proposed. Among those algorithms binary relevance (BR) is a w...

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Bibliographic Details
Main Authors: Wei Weng, Chin-Ling Chen, Shun-Xiang Wu, Yu-Wen Li, Juan Wen
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8777079/