Quantifying the Plasmonic Generation Rate of Non‐Thermal Hot Carriers with an AlGaN/GaN High‐Electron‐Mobility Transistor

Abstract Plasmonic generation of hot carriers in metallic nanostructures has attracted much attention due to its great potential in several applications. However, it is highly debated whether the enhancement is due to the hot carriers or the thermal effect. Here, the ability to exclude the thermal e...

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Bibliographic Details
Main Authors: Chun‐Yu Li, Chi‐Ching Liu, Wei‐Chih Lai, Yung‐Chiang Lan, Yun‐Chorng Chang
Format: Article
Language:English
Published: Wiley 2021-07-01
Series:Advanced Science
Subjects:
GaN
Online Access:https://doi.org/10.1002/advs.202100362