SmS/EuS/SmS Tri-Layer Thin Films: The Role of Diffusion in the Pressure Triggered Semiconductor-Metal Transition

SmS/EuS/SmS Tri-Layer Thin Films: The Role of Diffusion in the Pressure Triggered Semiconductor-Metal Transition

While SmS thin films show an irreversible semiconductor-metal transition upon application of pressure, the switching characteristics can be modified by alloying with other elements, such as europium. This manuscript reports on the resistance response of tri-layer SmS/EuS/SmS thin films upon applying...

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Bibliographic Details
Main Authors: Andreas Sousanis, Dirk Poelman, Philippe F. Smet
Format: Article
Language:English
Published: MDPI AG 2019-10-01
Series:Nanomaterials
Subjects:
sms
eus
semiconductor-metal transition
structural properties
piezoresistivity
interdiffusion
rare earths
thin films
Online Access:https://www.mdpi.com/2079-4991/9/11/1513

Internet

https://www.mdpi.com/2079-4991/9/11/1513

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