Optimal Partial Reconfiguration for Permanent Fault Recovery on SRAM-Based FPGAs in Space Mission

In this paper, we present a technique to maximize the lifetime of SRAM-based FPGAs in space mission. We focus on recovering permanent faults induced by SEE (single-events effect). In our technique, we use a fix-sized fault detection module to detect permanent faults and propose a permanent fault rec...

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Bibliographic Details
Main Authors: Jie Zhang, Yong Guan, Chunjing Mao
Format: Article
Language:English
Published: SAGE Publishing 2013-01-01
Series:Advances in Mechanical Engineering
Online Access:https://doi.org/10.1155/2013/783673