The electromigration effect revisited: non-uniform local tensile stress-driven diffusion

Abstract The electromigration (EM) effect involves atomic diffusion of metals under current stressing. Recent theories of EM are based on the unbalanced electrostatic and electron-wind forces exerted on metal ions. However, none of these models have coupled the EM effect and lattice stability. Here,...

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Bibliographic Details
Main Authors: Shih-kang Lin, Yu-chen Liu, Shang-Jui Chiu, Yen-Ting Liu, Hsin-Yi Lee
Format: Article
Language:English
Published: Nature Publishing Group 2017-06-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-017-03324-5