Dynamic Uncertainty for Compensated Second-Order Systems
The compensation of LTI systems and the evaluation of the according uncertainty is of growing interest in metrology. Uncertainty evaluation in metrology ought to follow specific guidelines, and recently two corresponding uncertainty evaluation schemes have been proposed for FIR and IIR filtering. We...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2010-08-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | http://www.mdpi.com/1424-8220/10/8/7621/ |