High aspect ratio etched sub-micron structures in silicon obtained by cryogenic plasma deep-etching through perforated polymer thin films

Cryogenic plasma deep-etching for silicon sub-micron structures was studied with the use of modified poly(styrene) (PS) perforated masks obtained from laterally phase separated PS and poly (lactic acid) PLA blend thin films. PS mask was stained by heavy metal (ruthenium) or transferred to an interme...

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Bibliographic Details
Main Authors: M. Kulsreshath, A. Vital, P. Lefaucheux, C. Sinturel, T. Tillocher, M. Vayer, M. Boufnichel, R. Dussart
Format: Article
Language:English
Published: Elsevier 2018-11-01
Series:Micro and Nano Engineering
Online Access:http://www.sciencedirect.com/science/article/pii/S2590007218300091