Using Hampel Identifier to Eliminate Profile-Isolated Outliers in Laser Vision Measurement
In this paper, the profile of the bar is detected by laser vision technology. During the detection process, obvious isolated outliers can be observed in the profile data; dimension parameter and profile-fitting accuracy are seriously affected by these outliers. In order to eliminate these outliers a...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
2019-01-01
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| Series: | Journal of Sensors |
| Online Access: | http://dx.doi.org/10.1155/2019/3823691 |