Genome-Wide Association Mapping for Leaf Tip Necrosis and Pseudo-black Chaff in Relation to Durable Rust Resistance in Wheat

Genome-Wide Association Mapping for Leaf Tip Necrosis and Pseudo-black Chaff in Relation to Durable Rust Resistance in Wheat

The partial rust resistance genes and have been used extensively in wheat ( L.) improvement, as they confer exceptional durability. Interestingly, the resistance of is associated with the expression of leaf tip necrosis (LTN) and with pseudo-black chaff (PBC). Genome-wide association mapping usi...

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Bibliographic Details
Main Authors: Philomin Juliana, Jessica E. Rutkoski, Jesse A. Poland, Ravi P. Singh, Sivasamy Murugasamy, Senthil Natesan, Hugues Barbier, Mark E. Sorrells
Format: Article
Language:English
Published: Wiley 2015-07-01
Series:The Plant Genome
Online Access:https://dl.sciencesocieties.org/publications/tpg/articles/8/2/plantgenome2015.01.0002

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https://dl.sciencesocieties.org/publications/tpg/articles/8/2/plantgenome2015.01.0002

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