Genome-Wide Association Mapping for Leaf Tip Necrosis and Pseudo-black Chaff in Relation to Durable Rust Resistance in Wheat
The partial rust resistance genes and have been used extensively in wheat ( L.) improvement, as they confer exceptional durability. Interestingly, the resistance of is associated with the expression of leaf tip necrosis (LTN) and with pseudo-black chaff (PBC). Genome-wide association mapping usi...
Main Authors: | Philomin Juliana, Jessica E. Rutkoski, Jesse A. Poland, Ravi P. Singh, Sivasamy Murugasamy, Senthil Natesan, Hugues Barbier, Mark E. Sorrells |
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Format: | Article |
Language: | English |
Published: |
Wiley
2015-07-01
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Series: | The Plant Genome |
Online Access: | https://dl.sciencesocieties.org/publications/tpg/articles/8/2/plantgenome2015.01.0002 |
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