Photoconductivity Spectra of Amorphous Hydrogenated Silicon Films with Nanocrystalline Inclusions

The technique for the study of amorphous hydrogenated silicon films with nanocrystalline inclusions non-uniformly distributed through the thickness (pm-Si:H) deposited on glass substrates is devised. Photocurrent spectra for the films of various thicknesses are studied when illuminated from the free...

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Bibliographic Details
Main Authors: V. P. Afanasiev, A. V. Vasilev
Format: Article
Language:Russian
Published: Saint Petersburg Electrotechnical University "LETI" 2016-10-01
Series:Известия высших учебных заведений России: Радиоэлектроника
Subjects:
Online Access:https://re.eltech.ru/jour/article/view/134