Photoconductivity Spectra of Amorphous Hydrogenated Silicon Films with Nanocrystalline Inclusions
The technique for the study of amorphous hydrogenated silicon films with nanocrystalline inclusions non-uniformly distributed through the thickness (pm-Si:H) deposited on glass substrates is devised. Photocurrent spectra for the films of various thicknesses are studied when illuminated from the free...
Main Authors: | V. P. Afanasiev, A. V. Vasilev |
---|---|
Format: | Article |
Language: | Russian |
Published: |
Saint Petersburg Electrotechnical University "LETI"
2016-10-01
|
Series: | Известия высших учебных заведений России: Радиоэлектроника |
Subjects: | |
Online Access: | https://re.eltech.ru/jour/article/view/134 |
Similar Items
-
Improvement of Photovoltaic Cells Efficiency by Reducing Contamination in Single Chamber PECVD System by Passivation with a-Si:H and μc-Si:H Thin Films
by: B. DIACONU, et al.
Published: (2011-12-01) -
Light Effects on the Charge Storage in the A-SI:H Pin Diode
by: Wu, Shu-Hsien
Published: (2013) -
Modeling a Thick Hydrogenated Amorphous Silicon Substrate for Ionizing Radiation Detectors
by: Jeremy Alexander Davis, et al.
Published: (2020-05-01) -
An Amorphous Silicon Photo TFT with Si3N4/Al2O3 or HfO2 Double Layered Insulator for Digital Imaging Applications
by: Siham Belkacemi, et al. -
Energy-Efficient Wavelength Multiplexers Based on Hydrogenated Amorphous Silicon Resonators
by: T. Lipka, et al.
Published: (2015-01-01)