Application of Relative Entropy and Gradient Boosting Decision Tree to Fault Prognosis in Electronic Circuits

Fault prognosis of electronic circuits is the premise of guaranteeing normal operation of a system and carrying out on-condition maintenance. In this work, the remaining useful life (RUL) of electronic elements was estimated by selecting fault features based on variance, measuring fault severity bas...

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Bibliographic Details
Main Authors: Ling Wang, Dongfang Zhou, Hao Zhang, Wei Zhang, Jing Chen
Format: Article
Language:English
Published: MDPI AG 2018-10-01
Series:Symmetry
Subjects:
RUL
Online Access:http://www.mdpi.com/2073-8994/10/10/495