A Phenomenological Model for the Photocurrent Transient Relaxation Observed in ZnO-Based Photodetector Devices

A Phenomenological Model for the Photocurrent Transient Relaxation Observed in ZnO-Based Photodetector Devices

We present a phenomenological model for the photocurrent transient relaxation observed in ZnO-based metal-semiconductor-metal (MSM) planar photodetector devices based on time-resolved surface band bending. Surface band bending decreases during illumination, due to migration of photogenerated holes t...

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Bibliographic Details
Main Authors: James C. Moore, Cody V. Thompson
Format: Article
Language:English
Published: MDPI AG 2013-08-01
Series:Sensors
Subjects:
zinc oxide
ZnO
ultraviolet
photodetector
persistent photoconductivity
photoresponse
Online Access:http://www.mdpi.com/1424-8220/13/8/9921

Internet

http://www.mdpi.com/1424-8220/13/8/9921

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