Feedback Control in an Atomic Force Microscope Used as a Nano-Manipulator
This paper offers a concise survey of the most commonly used feedback loops for atomic force microscopes. In addition it proposes feedback control loops in order to minimize the effect of thermal noise on measurements of weak forces, and to improve the manipulability of the AFM. Growing requirements...
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| Format: | Article |
| Language: | English |
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CTU Central Library
2005-01-01
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| Series: | Acta Polytechnica |
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| Online Access: | https://ojs.cvut.cz/ojs/index.php/ap/article/view/742 |