High Sensitivity Refractometer Based on TiO2-Coated Adiabatic Tapered Optical Fiber via ALD Technology

High Sensitivity Refractometer Based on TiO2-Coated Adiabatic Tapered Optical Fiber via ALD Technology

Atomic layer deposition (ALD) technology is introduced to fabricate a high sensitivity refractometer based on an adiabatic tapered optical fiber. Different thicknesses of titanium dioxide (TiO2) nanofilm were coated around the tapered fiber precisely and uniformly under different deposition cycles....

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Bibliographic Details
Main Authors: Shan Zhu, Fufei Pang, Sujuan Huang, Fang Zou, Qiang Guo, Jianxiang Wen, Tingyun Wang
Format: Article
Language:English
Published: MDPI AG 2016-08-01
Series:Sensors
Subjects:
refractometer
adiabatic tapered optical fiber
titanium dioxide nanofilm
atomic layer deposition
Online Access:http://www.mdpi.com/1424-8220/16/8/1295

Internet

http://www.mdpi.com/1424-8220/16/8/1295

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