Porous Silicon Refractive Index Measurements with the Assistance of Two types of Lasers

Porous Silicon Refractive Index Measurements with the Assistance of Two types of Lasers

Porous Silicon (PSi) samples with (100) orientation n-type were prepared by photo-electrochemical etching process for different variable parameters and fixed electrolyte solution HF:C2H5OH:H2O (2:3:3). Physical and optical properties of PSi would be varied with the variation of process parameters s...

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Bibliographic Details
Main Author: Saad A. Mohammed Salih
Format: Article
Language:English
Published: Al-Nahrain Journal for Engineering Sciences 2017-11-01
Series:مجلة النهرين للعلوم الهندسية
Subjects:
Porous silicon
porosity
refractive index
etching
current density
AFM
Online Access:https://nahje.com/index.php/main/article/view/333

Internet

https://nahje.com/index.php/main/article/view/333

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