Semi-Supervised Multi-Label Dimensionality Reduction Based on Dependence Maximization

Like other machine learning paradigms, multi-label learning also suffers from the curse of dimensionality problem. Multi-label dimensionality reduction can alleviate the problem but they generally ask for sufficient labeled samples. Nevertheless, we often may only have scarce labeled samples and abu...

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Bibliographic Details
Main Authors: Yanming Yu, Jun Wang, Qiaoyu Tan, Lianyin Jia, Guoxian Yu
Format: Article
Language:English
Published: IEEE 2017-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8059761/