Semi-Supervised Multi-Label Dimensionality Reduction Based on Dependence Maximization
Like other machine learning paradigms, multi-label learning also suffers from the curse of dimensionality problem. Multi-label dimensionality reduction can alleviate the problem but they generally ask for sufficient labeled samples. Nevertheless, we often may only have scarce labeled samples and abu...
Main Authors: | Yanming Yu, Jun Wang, Qiaoyu Tan, Lianyin Jia, Guoxian Yu |
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Format: | Article |
Language: | English |
Published: |
IEEE
2017-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/8059761/ |
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