Resist Filling Study for UV Nanoimprint Lithography Using Stamps with Various Micro/Nano Ratios

Mixed micro- and nanoscale structures are gaining popularity in various fields due to their rapid advances in patterning. An investigation in stamp resist filling with multiscale cavities via ultraviolet (UV) nanoimprint lithography (UV-NIL) is necessary to improve stamp design. Here, simulations at...

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Bibliographic Details
Main Authors: Minqi Yin, Hongwen Sun, Haibin Wang
Format: Article
Language:English
Published: MDPI AG 2018-07-01
Series:Micromachines
Subjects:
Online Access:http://www.mdpi.com/2072-666X/9/7/335