Vibration Control of Scanning Electron Microscopes with Experimental Approaches for Performance Enhancement

A vibration isolator embedded in precision equipment, such as a scanning electron microscope (SEM), wafer inspection equipment, and nanoimprint lithography equipment, play a critical role in achieving the maximum performance of the equipment during the fabrication of nano/micro-electro-mechanical sy...

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Bibliographic Details
Main Authors: Yun-Ho Shin, Seok-Jun Moon, Yong-Ju Kim, Ki-Yong Oh
Format: Article
Language:English
Published: MDPI AG 2020-04-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/20/8/2277