Evaluation of metrology technologies for free form surfaces

This research work describes a novel approach for comparing different technologies for free form surface metrology: computerized tomography (CT), photogrammetry and coordinate measuring machines (CMM). The comparison has the aim of providing relevant information for the...

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Bibliographic Details
Main Authors: Arámbula K., Siller H.R., De Chiffre L., Rodríguez C.A., Cantatore A.
Format: Article
Language:English
Published: EDP Sciences 2012-01-01
Series:International Journal of Metrology and Quality Engineering
Subjects:
cmm
Online Access:https://www.metrology-journal.org/articles/ijmqe/pdf/2012/01/ijmqe120002.pdf