Evaluation of metrology technologies for free form surfaces
This research work describes a novel approach for comparing different technologies for free form surface metrology: computerized tomography (CT), photogrammetry and coordinate measuring machines (CMM). The comparison has the aim of providing relevant information for the...
Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
EDP Sciences
2012-01-01
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Series: | International Journal of Metrology and Quality Engineering |
Subjects: | |
Online Access: | https://www.metrology-journal.org/articles/ijmqe/pdf/2012/01/ijmqe120002.pdf |